The TriNano N100 nano CMM is specifically designed to suit the needs of high end research. The machine is able to reach uncertainties below 100nm, what is unique at its price level. Furthermore, it is possible to create a lab-environment within the machine itself; avoiding the need for a class-1 metrology lab.
Figure 1: N100 housing
Besides standard scanning and point-to-point measurements, the N100 can also be used as a platform for your own (fundamental) research on sensors, calibration methods, software, or measurement strategies.
Figure 2: N100 without its cover
| Description | Trinano N100 nano CMM | |
|---|---|---|
| Kinematics | 3D Abbe concept with ultra precision air bearings | |
| Measuring system | Ultra precision interferential length measuring system with glass-ceramic scales | |
| Air pressure control | Advanced | |
| Weight compensation | Standard | |
| Performance | ||
| Travel speed | 10 mm/s per axis | |
| Scan speed | 1 mm/s | |
| Linear measuring tolerance MPE complies with DIN EN ISO 10360-2 | 0.14 + L*/1000 µm | |
| * Measuring length L in mm | ||
| Ambient conditions | ||
| Operational range | ||
| Humidity | 40% to 60% | |
| Air temperature | +15°C to +30°C | |
| Thermal requirements to guarantee specifications | ||
| Ambient temperature** | 20°C ± 0.5K | |
| Temperature gradient** | 0.2k/h 0.4k/d 0.1k/m | |
| ** System with mini lab environment module has less stringent demands |
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